Figure 2.

AFM images of irradiated Si0.7Ge0.3 solid solution. AFM images of Si0.7Ge0.3 surfaces irradiated by the Nd:YAG laser at intensity (a) 2.0 MW/cm2; (b) 7.0 MW/cm2 and (c) 20.0 MW/cm2.

Medvid et al. Nanoscale Research Letters 2011 6:582   doi:10.1186/1556-276X-6-582
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