Figure 4.

STEM-HAADF micrograph and EDS analysis of the emitter contact stressed during 30 min. (a)The red dotted line represents the EDS line scan. (b) EDS line scan showing the elemental evolution along the longitudinal section of the emitter contact after 30 min of stress.

Alaeddine et al. Nanoscale Research Letters 2011 6:574   doi:10.1186/1556-276X-6-574
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