Figure 3.

STEM-HAADF micrograph and EDS analysis of the non-stressed emitter finger. (a) The red dotted line represents the EDS line scan. (b) EDS line scan showing the elemental composition along the longitudinal section of the emitter contact before stress. Yellow head arrows delimit dark zone.

Alaeddine et al. Nanoscale Research Letters 2011 6:574   doi:10.1186/1556-276X-6-574
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