SEM of ZnO films annealed in pure argon at temperatures from 750°C to 950°C. Annealed samples from films of initially identical morphology and average grain sizes show an increasing restructuring of film texture with higher annealing temperatures. (a) As-deposited ZnO film and ZnO films annealed at (b) 750°C, (c) 800°C, (d) 850°C, (e) 900°C, and (f) 950°C. Scale bar = 100 nm.
Pedersen et al. Nanoscale Research Letters 2011 6:568 doi:10.1186/1556-276X-6-568