Figure 9.

(a) Representation of the two-dimensional cuts shown in maps panels (b–g) performed on the finite element method simulations with periodic contour conditions at the substrate box edges. The color contours represent variations on the first axial principal strain, which allows a qualitative comparison with the GID data of Figure 8. Cuts on the bottom (b), middle (d) and top (f) of the average island of sample A show an elongated strain profile along the <a onClick="popup('http://www.nanoscalereslett.com/content/6/1/56/mathml/M1','MathML',630,470);return false;" target="_blank" href="http://www.nanoscalereslett.com/content/6/1/56/mathml/M1">View MathML</a> directions. Similar cuts for the average island of sample B are seen on (c), (e) and (g).

Villegas-Lelovsky et al. Nanoscale Res Lett 2011 6:56   doi:10.1007/s11671-010-9786-8