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Resolution: standard / high Figure 7.
Radial scans at the vicinity of the GaAs (022) (solid dots) and
(open dots) reflections for sample A (a) and B (b). Lateral size from iso-strain regions in samples A (c) and B (d) obtained from the width of transversal scans.
Villegas-Lelovsky et al. Nanoscale Res Lett 2011 6:56 doi:10.1007/s11671-010-9786-8 |