|
Resolution: standard / high Figure 3.
Depth profiles of the TiAl3Oxfilms. Annealed at (a) 773 K and (b) 1,073 K, respectively.
Shi and Liu Nanoscale Research Letters 2011 6:557 doi:10.1186/1556-276X-6-557 |
|
Resolution: standard / high Figure 3.
Depth profiles of the TiAl3Oxfilms. Annealed at (a) 773 K and (b) 1,073 K, respectively.
Shi and Liu Nanoscale Research Letters 2011 6:557 doi:10.1186/1556-276X-6-557 |
