Figure 5.

Contoured image of electric field between AFM probe and GaAs surface at different penetration depth. (a) 0.5 nm, (b) 1.0 nm, (c) 2.0 nm, and (d) the electric field profile along the horizontal cross-sectional lines for different depth conditions.

Ahn et al. Nanoscale Research Letters 2011 6:550   doi:10.1186/1556-276X-6-550
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