Figure 4.

Contoured image of electric field between AFM probe and GaAs surface at different applied voltages. (a) -5 V, (b) -10 V, (c) -15 V, and (d) the electric field profile along the vertical cross-sectional lines for different bias conditions.

Ahn et al. Nanoscale Research Letters 2011 6:550   doi:10.1186/1556-276X-6-550
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