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Resolution: standard / high Figure 3.
AFM measurement. (a) C-AFM measurement setup. (b) I-V curve measured by conductive AFM tip on the top of SnO2 nanobelt top surface. (c) Fitted lnI versus V curve at positive and negative bias voltages.
Wang et al. Nanoscale Research Letters 2011 6:541 doi:10.1186/1556-276X-6-541 |
