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Open Access Nano Express

The current image of single SnO2 nanobelt nanodevice studied by conductive atomic force microscopy

Shujie Wang, Gang Cheng, Ke Cheng, Xiaohong Jiang and Zuliang Du*

Author affiliations

Key Laboratory for Special Functional Materials, Henan University, Kaifeng 475004, People's Republic of China

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Citation and License

Nanoscale Research Letters 2011, 6:541  doi:10.1186/1556-276X-6-541

Published: 4 October 2011

Abstract

A single SnO2 nanobelt was assembled on a pair of Au electrodes by electric-field assembly method. The electronic transport property of single SnO2 nanobelt was studied by conductive atomic force microscopy (C-AFM). Back-to-back Schottky barrier-type junctions were created between AFM tip/SnO2 nanobelt/Au electrode which can be concluded from the I-V curve. The current images of single SnO2 nanobelt nanodevices were also studied by C-AFM techniques, which showed stripes patterns on the nanobelt surface. The current images of the nanobelt devices correlate the microscopy with separate transport properties measurement together.

Keywords:
SnO2 nanobelt; C-AFM; current image