The current image of single SnO2 nanobelt nanodevice studied by conductive atomic force microscopy
Key Laboratory for Special Functional Materials, Henan University, Kaifeng 475004, People's Republic of China
Nanoscale Research Letters 2011, 6:541 doi:10.1186/1556-276X-6-541Published: 4 October 2011
A single SnO2 nanobelt was assembled on a pair of Au electrodes by electric-field assembly method. The electronic transport property of single SnO2 nanobelt was studied by conductive atomic force microscopy (C-AFM). Back-to-back Schottky barrier-type junctions were created between AFM tip/SnO2 nanobelt/Au electrode which can be concluded from the I-V curve. The current images of single SnO2 nanobelt nanodevices were also studied by C-AFM techniques, which showed stripes patterns on the nanobelt surface. The current images of the nanobelt devices correlate the microscopy with separate transport properties measurement together.