Figure 4.

Characterization data for NaYF4: 20% Yb3+, 2% Er3+ UCNPs after annealing. (A) TEM image. (B) XRD pattern (cubic phase is marked with asterisks) and the calculated line pattern for hexagonal phase of NaYF4 (JCPDS card, No. 28-1192).

Shan et al. Nanoscale Research Letters 2011 6:539   doi:10.1186/1556-276X-6-539
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