Figure 2.

TEM characterization of the Ti33Cu67 ribbon crystallized under a pulse of electrical current, sample N1. (a) HRTEM micrograph; (b) selected area diffraction pattern; (c) dark-field electron image showing a larger area of the sample.

Dudina et al. Nanoscale Research Letters 2011 6:512   doi:10.1186/1556-276X-6-512
Download authors' original image