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Resolution: standard / high Figure 2.
TEM characterization of the Ti33Cu67 ribbon crystallized under a pulse of electrical current, sample N1. (a) HRTEM micrograph; (b) selected area diffraction pattern; (c) dark-field electron image showing a larger area of the sample.
Dudina et al. Nanoscale Research Letters 2011 6:512 doi:10.1186/1556-276X-6-512 |
