Figure 6.

Frequency dependence of k-value of La0.35Zr0.65O2 dielectric for as-deposited and PDA samples. Significant dielectric relaxation was observed in the air-annealed sample. Solid lines are the fitting results using equations (1) and (2).

Zhao et al. Nanoscale Res Lett 2011 6:48   doi:10.1007/s11671-010-9782-z