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Resolution: standard / high Figure 5.
The relationship between leakage current density (Jg) and electric field (Eox) applied across the La0.35Zr0.65O2/IL (IL stands for interfacial layer) stacks for as-deposited and PDA samples. Break-down voltages (VBD) were indicated.
Zhao et al. Nanoscale Res Lett 2011 6:48 doi:10.1007/s11671-010-9782-z |
