Figure 4.

(a) C–V results at different frequencies from the air-annealed sample. Significant frequency dispersion was observed. (b) No frequency dispersion in C–V measurements was observed in the thermal oxide (SiO2) sample with the back-side contact prepared in the same way as for the LaZrO sample shown in (a).

Zhao et al. Nanoscale Res Lett 2011 6:48   doi:10.1007/s11671-010-9782-z