|
Resolution: standard / high Figure 1.
a Low magnification of TEM view of GONs-OA, b rippled GONs-OA with waves, c HRTEM
image of as-prepared GONs-OA and d corresponding to the selected area electron diffraction
pattern (SAED).
Yu et al. Nanoscale Res Lett 2011 6:47 doi:10.1007/s11671-010-9779-7 |
