Figure 1.

a Low magnification of TEM view of GONs-OA, b rippled GONs-OA with waves, c HRTEM image of as-prepared GONs-OA and d corresponding to the selected area electron diffraction pattern (SAED).

Yu et al. Nanoscale Res Lett 2011 6:47   doi:10.1007/s11671-010-9779-7