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Impedance of nanometer thickness ferromagnetic Co40Fe40B20 films

Shien Uang Jen1*, Tzu Yang Chou1 and Chi Kuen Lo2

Author Affiliations

1 Institute of Physics, Academia Sinica, Taipei, Taiwan, 11529, Republic of China

2 Physics Dept, National Taiwan Normal University, Taipei, Taiwan, 11677, Republic of China

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Nanoscale Research Letters 2011, 6:468  doi:10.1186/1556-276X-6-468

Published: 23 July 2011


Nanocrystalline Co40Fe40B20 films, with film thickness tf = 100 nm, were deposited on glass substrates by the magnetron sputtering method at room temperature. During the film deposition period, a dc magnetic field, h = 40 Oe, was applied to introduce an easy axis for each film sample: one with h||L and the other with h||w, where L and w are the length and width of the film. Ferromagnetic resonance (FMR), ultrahigh frequency impedance (IM), dc electrical resistivity (ρ), and magnetic hysteresis loops (MHL) of these films were studied. From the MHL and r measurements, we obtain saturation magnetization 4πMs = 15.5 kG, anisotropy field Hk = 0.031 kG, and r = 168 mW.cm. From FMR, we can determine the Kittel mode ferromagnetic resonance (FMR-K) frequency fFMRK = 1,963 MHz. In the h||L case, IM spectra show the quasi-Kittel-mode ferromagnetic resonance (QFMR-K) at f0 and the Walker-mode ferromagnetic resonance (FMR-W) at fn, where n = 1, 2, 3, and 4. In the h||w case, IM spectra show QFMR-K at F0 and FMR-W at Fn. We find that f0 and F0 are shifted from fFMRK, respectively, and fn = Fn. The in-plane spin-wave resonances are responsible for those relative shifts.

PACS No. 76.50.+q; 84.37.+q; 75.70.-i

spin-wave resonance; impedance; magnetic films