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Resolution: standard / high Figure 5.
TEM data of the A-plane sample, with viewing direction
 . (a) Diffraction pattern of the GaN film of the A-plane GaN sample. (b) and (c) show bright field images of the same sample taken in the two beam conditions with
 = (0002) and  , respectively.
Shih et al. Nanoscale Research Letters 2011 6:425 doi:10.1186/1556-276X-6-425 |
