Figure 1.

TEM data of the M -plane sample, with viewing direction [0001]. Parts (a) and (b) display the electron diffraction patterns of the GaN film and the LGO substrate seen in the bright field image of the M -plane GaN film (c), respectively.

Shih et al. Nanoscale Research Letters 2011 6:425   doi:10.1186/1556-276X-6-425
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