SEM images of Ge islands grown on a FIB pre-patterned region with (a) smaller (approx. 160 nm) and (b) larger (approx. 500 nm) spacing of holes. The circles drawn in Figure 1a show the ordering of islands along the circular periphery. The inset in (b) shows the array of islands in higher magnification.
Das et al. Nanoscale Research Letters 2011 6:416 doi:10.1186/1556-276X-6-416