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Resolution: standard / high Figure 1.
A schematic diagram of the flexible ZnO/Al-NPs memory TFT and the cross-sectional
device structure (inset) (a), and a cross-sectional TEM image of the stacked gate layer (b). The left inset is a planar HRTEM image of Al NPs on the SiO2 layer, and the right inset shows the EDX elemental mapping of Al (cyan), Si (red), and O (blue). A photographic image showing the ZnO/Al-NPs memory TFTs on a flexible plastic substrate
(c).
Park et al. Nanoscale Res Lett 2011 6:41 doi:10.1007/s11671-010-9789-5 |