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Resolution: standard / high Figure 1.
AFM images of the HfO2 nanopattern. (a) Three-dimensional view of the nanostructured HfO2/GaAs surface morphology. (b) Cross-section scan profile of an etched trench.
Benedicto et al. Nanoscale Research Letters 2011 6:400 doi:10.1186/1556-276X-6-400 |
