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Scaling properties of ballistic nano-transistors

Ulrich Wulf*, Marcus Krahlisch and Hans Richter

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BTU Cottbus, Fakultät 1, Postfach 101344, 03013 Cottbus, Germany

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Citation and License

Nanoscale Research Letters 2011, 6:365  doi:10.1186/1556-276X-6-365

Published: 28 April 2011


Recently, we have suggested a scale-invariant model for a nano-transistor. In agreement with experiments a close-to-linear thresh-old trace was found in the calculated ID - VD-traces separating the regimes of classically allowed transport and tunneling transport. In this conference contribution, the relevant physical quantities in our model and its range of applicability are discussed in more detail. Extending the temperature range of our studies it is shown that a close-to-linear thresh-old trace results at room temperatures as well. In qualitative agreement with the experiments the ID - VG-traces for small drain voltages show thermally activated transport below the threshold gate voltage. In contrast, at large drain voltages the gate-voltage dependence is weaker. As can be expected in our relatively simple model, the theoretical drain current is larger than the experimental one by a little less than a decade.