Figure 6.

AFM measurement using Dimension 3000 for SAE-grown InGaN/GaN QDs arrays on sample A after removal of SiNx: (a) AFM scan with the scale of 0.5 μm × 0.5 μm; (b) the corresponding height and size of the cross-sectional profiles.

Liu et al. Nanoscale Research Letters 2011 6:342   doi:10.1186/1556-276X-6-342
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