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Cohesive strength of nanocrystalline ZnO:Ga thin films deposited at room temperature

Anura Priyajith Samantilleke1*, Luís Manuel Fernandes Rebouta1*, Vitor Garim1, Luis Rubio-Peña2, Senetxu Lanceros-Mendez1, Pedro Alpuim1, Sandra Carvalho1, Alexey V Kudrin3 and Yury A Danilov3

Author affiliations

1 Centro de Física, Universidade do Minho, Azurém, 4800-058 Guimarães, Portugal

2 Engineering School, University of Cadiz, C/Chile, 1. 11002 Cádiz, Spain

3 Physical-Technical Research Institute, N. I. Lobachevskiy State University, Nihzniy Novgorod, Russia

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Citation and License

Nanoscale Research Letters 2011, 6:309  doi:10.1186/1556-276X-6-309

Published: 7 April 2011


In this study, transparent conducting nanocrystalline ZnO:Ga (GZO) films were deposited by dc magnetron sputtering at room temperature on polymers (and glass for comparison). Electrical resistivities of 8.8 × 10-4 and 2.2 × 10-3 Ω cm were obtained for films deposited on glass and polymers, respectively. The crack onset strain (COS) and the cohesive strength of the coatings were investigated by means of tensile testing. The COS is similar for different GZO coatings and occurs for nominal strains approx. 1%. The cohesive strength of coatings, which was evaluated from the initial part of the crack density evolution, was found to be between 1.3 and 1.4 GPa. For these calculations, a Young's modulus of 112 GPa was used, evaluated by nanoindentation.