Figure 3.

Twin topography-luminescence images. Top: (a-d) topography of a ZnO-ZnWO4 sputtered layer (2 × 2 μm2). Bottom: corresponding visible light emission cartography under illumination by X-ray beam from left to right below (e) and above (f) the Zn-Kα threshold (9.6 keV) and below (g) and above (h) the W-L3threshold (10.2 keV). On top of the images is indicated the X-ray primary energy.

Fauquet et al. Nanoscale Research Letters 2011 6:308   doi:10.1186/1556-276X-6-308
Download authors' original image