Figure 2.

XAFS-XEOL recorded spectra of - a: the sputtered ZnO film obtained in near-field; - b: the ZnO film (bottom) and of a reference stoichiometric ZnO powder (top) by conventional technique. Spectra are expanded for clarity.

Fauquet et al. Nanoscale Research Letters 2011 6:308   doi:10.1186/1556-276X-6-308
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