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Combining scanning probe microscopy and x-ray spectroscopy

Carole Fauquet1*, Maël Dehlinger1, Franck Jandard1, Sylvain Ferrero2, Daniel Pailharey2, Sylvia Larcheri3, Roberto Graziola3, Juris Purans4, Aniouar Bjeoumikhov5, Alexei Erko6, Ivo Zizak6, Brahim Dahmani7 and Didier Tonneau1

Author affiliations

1 Université de la Méditerranée, CNRS-CINaM, Faculté des Sciences de Luminy, case 913, 13288 Marseille cedex 09, France

2 AXESS TECH, 750 Chemin de Beaupré, 13760 Saint Cannat, France

3 Dipartimento di Fisica, Universita' di Trento, Via Sommarive 14, 38123 Trento, Italy

4 Latvian State Univ, Inst Solid State Phys, LV-1063 Riga, Latvia

5 IFG GmbH, Rudower Chaussee 29/31, 12489 Berlin, Germany

6 HZB-Synchrotron Bessy, Albert Einstein Strasse, 15, 12489 Berlin, Germany

7 LovaLite, 18 Rue A.Savary, 25000 Besançon, France

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Citation and License

Nanoscale Research Letters 2011, 6:308  doi:10.1186/1556-276X-6-308

Published: 7 April 2011


A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.