Ju-Hyung Yun, Yun C Park, Joondong Kim*, Hak-Joo Lee, Wayne A Anderson* and Jeunghee Park
* Corresponding authors: Joondong Kim joonkim@kimm.re.kr - Wayne A Anderson waanders@buffalo.edu
Nanoscale Research Letters 2011, 6:287 doi:10.1186/1556-276X-6-287
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