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Resolution: standard / high Figure 2.
AFM morphology and phase of SiC samples annealed at different temperatures. Surface morphology for the samples annealed at 1600 (a), 1700 (b) and 2000°C (c),
and corresponding phase maps on the same samples ((d), (e) and (f)).
Vecchio et al. Nanoscale Research Letters 2011 6:269 doi:10.1186/1556-276X-6-269 |
