|
Resolution: standard / high Figure 5.
Plan-view TEM micrograph of Ge NCs embedded in high-k matrix for (a) A-800, (b) A-900,
(c) F-800, and (d) F-900 samples.
Ray et al. Nanoscale Research Letters 2011 6:224 doi:10.1186/1556-276X-6-224 |
