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Resolution: standard / high Figure 1.
Typical AFM topographic images for (a) 2 min (sample 'GS-1') and (b) 5 min (sample
'GS-2') grown Ge islands deposited at a substrate temperature 500°C.
Ray et al. Nanoscale Research Letters 2011 6:224 doi:10.1186/1556-276X-6-224 |
