Figure 1.

Typical AFM topographic images for (a) 2 min (sample 'GS-1') and (b) 5 min (sample 'GS-2') grown Ge islands deposited at a substrate temperature 500°C.

Ray et al. Nanoscale Research Letters 2011 6:224   doi:10.1186/1556-276X-6-224
Download authors' original image