Figure 3.

AFM images of site-selective InAs QDs grown on a pre-structured substrate. Besides good site-selectivity larger areas of defects are apparent (white circles), (a). Magnified image with linescans of a double dot (top) and a defect hole (bottom), (b).

Helfrich et al. Nanoscale Research Letters 2011 6:211   doi:10.1186/1556-276X-6-211
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