|
Resolution: standard / high Figure 3.
AFM images of site-selective InAs QDs grown on a pre-structured substrate. Besides good site-selectivity larger areas of defects are apparent (white circles),
(a). Magnified image with linescans of a double dot (top) and a defect hole (bottom),
(b).
Helfrich et al. Nanoscale Research Letters 2011 6:211 doi:10.1186/1556-276X-6-211 |