Figure 2.
AFM images of a typical surface quantum dot sample; different positions on a 2 in.
wafer; the deposited In increases from left to right and from top to bottom going from just a wetting layer (left upper image) to a concentration of 4 × 1010 dots/cm2 in the right lower image.
Mitin et al. Nanoscale Res Lett 2011 6:21 doi:10.1007/s11671-010-9767-y |
