AFM images of Ag NPs deposited on an n-GaN layer before and after annealing. (a) Before annealing and (b) after annealing. After deposition, the particle size is significantly enlarged for better enhancement. AFM, atomic force microscopy. Reproduced from . Copyright WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, 2008.
Gu et al. Nanoscale Research Letters 2011 6:199 doi:10.1186/1556-276X-6-199