Figure 5.

AFM images of Ag NPs deposited on an n-GaN layer before and after annealing. (a) Before annealing and (b) after annealing. After deposition, the particle size is significantly enlarged for better enhancement. AFM, atomic force microscopy. Reproduced from [33]. Copyright WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, 2008.

Gu et al. Nanoscale Research Letters 2011 6:199   doi:10.1186/1556-276X-6-199
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