Table 2 |
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Values of the experimental ratio Rexp of the HAADF intensity IHAADF of sublayer #2 to those of the three alloys (GaAs substrate, In0.51Ga0.49P and Al0.26Ga0.74As) contained in the sample and used as standards |
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Rexp |
0.97 |
1.03 |
1.06 |
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Frigeri et al. Nanoscale Research Letters 2011 6:194 doi:10.1186/1556-276X-6-194 |
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