Table 1

Values of the experimental ratio Rexp of the HAADF intensity IHAADF of sublayer #1 to those of the three alloys (GaAs substrate, In0.51Ga0.49P and Al0.26Ga0.74As) contained in the sample and used as standards.

<a onClick="popup('http://www.nanoscalereslett.com/content/6/1/194/mathml/M3','MathML',630,470);return false;" target="_blank" href="http://www.nanoscalereslett.com/content/6/1/194/mathml/M3">View MathML</a>

<a onClick="popup('http://www.nanoscalereslett.com/content/6/1/194/mathml/M4','MathML',630,470);return false;" target="_blank" href="http://www.nanoscalereslett.com/content/6/1/194/mathml/M4">View MathML</a>

<a onClick="popup('http://www.nanoscalereslett.com/content/6/1/194/mathml/M5','MathML',630,470);return false;" target="_blank" href="http://www.nanoscalereslett.com/content/6/1/194/mathml/M5">View MathML</a>


Rexp

1.02

1.09

1.12


Frigeri et al. Nanoscale Research Letters 2011 6:194   doi:10.1186/1556-276X-6-194

Open Data