Nano Express

Chemical characterization of extra layers at the interfaces in MOCVD InGaP/GaAs junctions by electron beam methods

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Cesare Frigeri^*, Alexey A Shakhmin, Dmitry A Vinokurov and Maria V Zamoryanskaya

Nanoscale Research Letters 2011, 6:194 doi:10.1186/1556-276X-6-194

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