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Chemical characterization of extra layers at the interfaces in MOCVD InGaP/GaAs junctions by electron beam methods

Cesare Frigeri*, Alexey Aleksandrovich Shakhmin, Dmitry Anatolievich Vinokurov and Maria Vladimirovna Zamoryanskaya

Nanoscale Research Letters 2011, 6:194  doi:10.1186/1556-276X-6-194

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