Yurong He*, Cong Qi*, Yanwei Hu, Bin Qin, Fengchen Li and Yulong Ding
* Corresponding authors: Yurong He rong@hit.edu.cn - Cong Qi qicongkevin@163.com
Nanoscale Research Letters 2011, 6:184 doi:10.1186/1556-276X-6-184
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