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Resolution: standard / high Figure 2.
XRD patterns and PL spectra of SRSO/SiO2 multilayers. (a) GI-XRD patterns measured for [2-nm-SRSO/SiO2]20 and [3-nm-SRSO/SiO2]20 multistacks annealed at 1,100°C for 60 min. Inset, PL spectra of the same MLs. The
thickness of SRSO layer for each ML is mentioned in the figure. (b) PL properties of the [2-nm-SRSO/SiO2]20 ML versus annealing temperature; annealing time is 15 min.
Khomenkova et al. Nanoscale Research Letters 2011 6:172 doi:10.1186/1556-276X-6-172 |
