SpringerOpen Newsletter

Receive periodic news and updates relating to SpringerOpen.

Download references

Open Access

Electrical behavior of MIS devices based on Si nanoclusters embedded in SiOxNy and SiO2 films

Emmanuel Jacques*, Laurent Pichon, Olivier Debieu and Fabrice Gourbilleau

Nanoscale Research Letters 2011, 6:170  doi:10.1186/1556-276X-6-170

Include


Format