Open Access Nano Express

Electrical behavior of MIS devices based on Si nanoclusters embedded in SiOxNy and SiO2 films

Emmanuel Jacques*, Laurent Pichon, Olivier Debieu and Fabrice Gourbilleau

Nanoscale Research Letters 2011, 6:170  doi:10.1186/1556-276X-6-170

Accesses  

  • Last 30 days: 56 accesses
  • Last 365 days: 743 accesses
  • All time: 2589 accesses