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Resolution: standard / high Figure 2.
The photograph and AFM images of the aluminum substrate with grating prepatterns (a)
sample after RD-WETS. (b) procedure with pitch of 555 nm; (c) 277 nm.
Lai et al. Nanoscale Research Letters 2011 6:157 doi:10.1186/1556-276X-6-157 |
