Local morphology images after FE-MISPC resulting in non-conductive pits. (a) AFM topography; (e) CS-AFM of the same spot, and their corresponding cross sections (c, g); (b) AFM topography of the same area after the second deposition; (f) CS-AFM and the respective cross sections (d, h). The cross sections are indicated by arrows next to the AFM images.
Verveniotis et al. Nanoscale Research Letters 2011 6:145 doi:10.1186/1556-276X-6-145