Figure 1.

Local topography images after. (a) the FE-MISPC process and (c) the second deposition of the same spot. Their cross sections are plotted in (b, d), respectively. (e, g) CS-AFM images corresponding to (a) and (c), respectively. Their cross sections are plotted in (f, h), respectively. Positions of the cross sections are indicated by arrows next to the images.

Verveniotis et al. Nanoscale Research Letters 2011 6:145   doi:10.1186/1556-276X-6-145
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