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Resolution: standard / high Figure 3.
Optical microscopy of a SLEG grown on 8° off-axis semi-insulating SiC substrate. (a) before contact and (b) after contacting in a Hall Bar configuration for Hall Effect measurement.
Camara et al. Nanoscale Research Letters 2011 6:141 doi:10.1186/1556-276X-6-141 |
