Figure 2.

AFM images of continuous and almost free standing monolayer graphene islands grown on the C-face of an 8° off-axis 4H-SiC substrate. (a) at a large scale, the zoom in (b) showing the wrinkle and the step bunched character of the SiC surface below and (c) a layer scratched by an AFM tip.

Camara et al. Nanoscale Research Letters 2011 6:141   doi:10.1186/1556-276X-6-141
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